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Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface

Creator:

Collins, Liam; Kilpatrick, J. I.; Vlassiouk, Ivan V.; Weber, Stefan A. L.; Rodriguez, Brian J.; et al.;

Institution: American Institute of Physics
Subject Keywords: Graphene; Kelvin; Solid-liquid; Electrochemistry; Surface potential;
Region:
Description:

Kelvin probe force microscopy (KPFM) is a powerful technique for the determination of the contact potential difference (CPD) between an atomic force microscope tip and a sample under ambient and vacuum conditions. However, for many energy storage and conversion systems, including graphene-based electrochemical capacitors, understanding electrochemical phenomena at the solid¿liquid interface is paramount. Despite the vast potential to provide fundamental insight for energy storage materials at the nanoscale, KPFM has found limited applicability in liquid environments to date. Here, using dual harmonic (DH)-KPFM, we demonstrate CPD imaging of graphene in liquid. We find good agreement with measurements performed in air, highlighting the potential of DH-KPFM to probe electrochemistry at the graphene¿liquid interface.

Related: http://dx.doi.org/10.1063/1.4870074
Suggested citation:

Collins, Liam; Kilpatrick, J. I.; Vlassiouk, Ivan V.; Weber, Stefan A. L.; Rodriguez, Brian J.; et al.; . () Dual harmonic Kelvin probe force microscopy at the graphene-liquid interface [Online]. Available from: http://publichealthwell.ie/node/776055 [Accessed: 21st September 2019].

  

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